SCAN-BEST: Sub-6GHz-Aided Near-Field Beam Selection with Formal Reliability Guarantees

Deng, Weicao, Shi, Binpu, Li, Min and Simeone, Osvaldo (2026) SCAN-BEST: Sub-6GHz-Aided Near-Field Beam Selection with Formal Reliability Guarantees. IEEE Transactions on Cognitive Communications and Networking, 12. pp. 5506-5521. ISSN 2332-7731

Text 2503.13801v5.pdf - Accepted Version Available under License Creative Commons Attribution. Download (2MB)

Official URL:	https://doi.org/10.1109/TCCN.2026.3657091
Item Type:	Article
Disciplines:	Computing, Maths, Engineering and Natural Sciences > Computing and Information Systems
Depositing User:	Osvaldo Simeone
Date Deposited:	10 Apr 2026 15:22
Last Modified:	10 Apr 2026 15:22
URI:	https://nul.repository.guildhe.ac.uk/id/eprint/2714

Actions (login required)

Edit Item